EDX-7000/EDX-8000 PCEDX-Navi Software Instruction Manual. DEFAULT
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305-32183-00 Инструкция по эксплуатации аппаратного обеспечения EDX-7000 / EDX-8000.
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C142-E037A
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000EDX-8000
C142-E037A_EDX-7000_8000.indd 1 13/11/11 19:04
C142-E037A_EDX-7000_8000.indd 2 13/11/11 19:04
O n e E D X o v e r a l l o t h e r s
Energy Dispersive X-ray Fluorescence SpectrometerEDX-7000/8000
C142-E037A_EDX-7000_8000.indd 3 13/11/11 19:04
Electron Paths and Principle of X-ray Generation Expressed as a Bohr Model
Supports Various Applications in Many Fields
Principle and Features of X-ray Fluorescence Spectrometry
M shell
X-ray(λ=λ0)
X-ray
Atomic nucleus Electron Hole
Lα
Kβ
Kα
L shell
K shell
M
L
K
Principle of Fluorescent X-ray Generation
Electrical/electronic materials
Ferrous/non-ferrous metals
Oil and petrochemicals
Chemicals
Ceramics
Environment
Automobiles and machinery
Pharmaceuticals
Agriculture and foods
Other
Mining
When a sample is irradiated with X-rays from an X-ray tube, the
atoms in the sample generate unique X-rays that are emitted from
the sample. Such X-rays are known as «fluorescent X-rays» and
they have a unique wavelength and energy that is characteristic of
each element that generates them. Consequently, qualitative
analysis can be performed by investigating the wavelengths of the
X-rays. As the fluorescent X-ray intensity is a function of the
concentration, quantitative analysis is also possible by measuring
the amount of X-rays at the wavelength specific to each element.
・RoHS and halogen screening
・Thin-film analysis for semiconductors, discs, liquid crystals, and
solar cells
・Main component analysis and impurity analysis of raw materials,
alloys, solder, and precious metals
・Composition analysis of slag
・Analysis of sulfur in oil
・Analysis of additive elements and mixed elements in lubricating oil
・Analysis of products and organic/inorganic raw materials
・Analysis of catalysts, pigments, paints, rubber, and plastics
・Analysis of soil, effluent, combustion ash, filters, and fine
particulate matter
・ELV hazardous element screening
・Composition analysis, plating thickness measurement, and chemical
conversion coating film weight measurement for machine parts
・Analysis of residual catalyst during synthesis
・Analysis of impurities and foreign matter in active pharmaceutical
ingredients
・Analysis of soil, fertilizer, and plants
・Analysis of raw ingredients, control of added elements, and
analysis of foreign matter in foods
・Composition analysis of archeological samples and precious stones,
analysis of toxic heavy metals in toys and everyday goods
・Grade analysis for mineral processing
・Analysis of ceramics, cement, glass, bricks, and clay
Agriculture and fo
Other
・Analysis of residual catalyst
・Analysis of impurities and f
ingredients
・Analysis of soil, fertilizer, an
・Analysis of raw ingredients
analysis of foreign matter in
・Composition analysis of arc
analysis of toxic heavy meta
・Grade analysis for mineral processing
4
C142-E037A_EDX-7000_8000.indd 4 13/11/11 19:04
5
EDX-7000/8000 Instrument Construction
Collimator
Sample
Primary filter
X-ray tube
Detector
C142-E037A_EDX-7000_8000.indd 5 13/11/11 19:05
Sample External Appearance
Measurement time Required to Reach the Target Analysis Precision
Relationship Between Measurement Time andStandard Deviation (Variance in Quantitation Values)
Standarddeviation
Measurement time
Measurement time
Unrivaled Analy tical Performance
Comparison of the Lower Limit of Detection in a Light Element Matrix Profile Comparison for Lead (Pb) in Copper Alloy
Approx. 1/10 measurement time
6
High Sensitivity − Lower Limit of Detection Improved 1.5 to 5 Times! −
Comparison Using Actual Samples
High Speed − Throughput Increased by up to a Factor of 10 −
The high-performance SDD detector and optimized hardware achieve a high level of sensitivity, analysis speed, and energy resolution that were previously unattainable. The EDX-8000 system also permits detection from 6C.
EDX-7000/8000
Previous model
Repeatability using the EDX-7000/8000
and the previous model were compared for
lead (Pb) in lead-free solder.
The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high levels of
sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to heavy elements.
The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time.
This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the
Main component element.
Extending the Measurement time to increase the fluorescent
X-ray count can improve the precision (repeatability) of X-ray
fluorescence spectrometry.
The EDX-7000/8000 incorporates a high-count-rate SDD
detector that achieves highly precise analysis of the target in a
shorter Measurement time than the previous model.
EDX-7000/8000Previous model
10.0 11.0 12.0 13.0
EDX-7000/8000Previous model
10
10000.0
1000.0
100.0
10.0
1.0
0.115 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90
EDX-7000Previous model
Atomic number
Lower limit of detection [ppm]
C142-E037A_EDX-7000_8000.indd 6 13/11/11 19:05
10%~ 0.5%~ 100ppm~ 10ppm~ 1ppm~ 0.1ppm~
EDX-7000 Previous model
Comparison of Energy Resolutions (sample: PPS resin)
・ An optional vacuum measurement unit or helium purge unit is required to measure light elements (15P and below) with the EDX-7000.・ An optional vacuum measurement unit is required to measure light elements (15P and below) with the EDX-8000・ Lower detection limit vary depending on the sample matrix or coexisting elements.
LiF CF2
CaF2
Profile of Fluorine (F) by EDX-8000
Lower Detection Limits
He2
Ne10
Ar18
Kr36
Xe54
Rn86
F9
Cl17
Br35
I53
At85
O8
S16
Se34
Te52
Po84
Lv116
N7
P15
As33
Sb51
Bi83
C6
Si14
Ge32
Sn50
Pb82
Fl114
B5
Al13
Ga31
In49
Tl81
Zn30
Cd48
Hg80
Cn112 113
Cu29
Ag47
Au79
Rg111
Ni28
Pd46
Pt78
Ds110
Co27
Rh45
Ir77
Mt109
Fe26
Ru44
Os76
Hs108
Mn25
Tc43
Re75
Bh107
Cr24
Mo42
W74
Sg106
V23
Nb41
Ta73
Db105
Ti22
Zr40
Hf72
Rf104
Lu71
Lr103
Yb70
No102
Tm69
Md101
Er68
Fm100
Ho67
Es99
Dy66
Cf98
Tb65
Bk97
Gd64
Cm96
Eu63
Am95
Sm62
Pu94
Pm61
Np93
Nd60
U92
Pr59
Pa91
Ce58
Th90
La57
Ac89
Sc21
Y39
Be4
Mg12
Ca20
Sr38
Ba56
*57-71
Ra88
**89-103
*
**
H1
UUt UUp115
Uus117
Uuo118
1 18
2 13 14 15 16 17
Li3
Na11
K19
Rb37
Cs55
Fr87
1
2
3
4
5
6
7
6
7
EDX-7000: 11Na to 92U
EDX-8000: 6C to 92U
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 7
Range of Detected Elements
No Liquid Nitrogen Required
High Resolution
Ultra-Light Element Analysis by EDX-8000
The SDD detector is electronically cooled, eliminating the need for cooling by liquid nitrogen. This frees the user from the chore of replenishing
the liquid nitrogen and contributes to lower running costs.
The EDX-7000/8000 instruments achieve superior energy
resolution compared to previous models by incorporating a
state-of-the-art SDD detector.
This reduces the effects of overlapping peaks of different
elements, enhancing the reliability of the analysis results.
The EDX-8000 features an SDD detector with a special ultra-thin-film window
material that is able to detect ultra-light elements such as carbon (C), oxygen (O),
and fluorine (F)
C142-E037A_EDX-7000_8000.indd 7 13/11/11 19:05
Extremely Flexible
5 mm dia. Collimator Selected,Using Micro X-Cell
1 mm dia. Collimator Selected
8
Automatic collimator switching in four stages: 1, 3, 5, and 10 mm diameter
Sample observation camera included standard
Sample Observation Camera and Collimators
Automatic Replacement of Five Primary Filters
Freely Combine Collimators and Primary Filters
Select the irradiation chamber from four values to suit the sample
size.
Select the most appropriate irradiation diameter for the sample
shape: 1 mm diameter for trace foreign matter analysis or defect
analysis; 3 mm or 5 mm diameter for small sample volumes.
Use the sample observation camera to confirm the X-ray irradiation
position on a specific position to measure small samples, samples
comprising multiple areas, or when using a Micro X-Cell.
The collimators and primary filters are driven independently and can be combined to address specific requirements. Select the optimal
combination from 24 (6 filters x 4 collimators) available options.
Quantitative analysis using the FP method is possible with all combinations.
Filter
#1
#2
#3
#4
#5
15~24
2~5
5~7
5~13
21~24(5~13)*
Target Elements (Examples)
Zr, Mo, Ru, Rh, Cd
Cl, Cr
Cr
Hg, Pb, Br
Cd (Hg, Pb, Br)
Primary filters enhance detection sensitivity by reducing the
continuous X-rays and the characteristic X-rays from the X-ray tube.
They are useful for the analysis of trace elements.
The EDX-7000/8000 incorporates five primary filters as standard (six,
including the open position), which can be automatically changed
using the software.
Accommodates all types of samples from small to large, from powders to liquids. Options include a vacuum measurement unit and helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements.
* This filter also cuts the background in the energy range shown in parentheses ( ).
Effective Energy (keV)
RhK line
Background fromcontinuous X-rays
RhL line
Filter. #2 Filter. #4
Sample : Hg/Pb-containing PE resin Sample : Rh/Cd-containing aqueous solutionSample : Cl-containing PE resin
Effect of the Primary Filters
Filter. #1
C142-E037A_EDX-7000_8000.indd 8 13/11/11 19:05
Atomic No.
Rel
ativ
e in
ten
sity
(%
)
455 15 25 35
100
80
60
40
20
0Na
Mg Al
Si P
S
Cl
K Ca
Ti Cr
Fe Zn Br Zr Cd
Profile Comparison in Vacuum and Air(sample: soda-lime glass)
Relative Sensitivity of Measurements with Helium Purging and in Air(sensitivity in vacuum = 100)
airHe
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 9
Optional Vacuum Measurement Unit and Helium Purge Unit
Advanced Helium Purge Unit (Option)
12-Sample Turret (Option)
Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium
purge unit.
The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.
This proprietary system (Patent pending : PCT/JP2013/075569)
efficiently purges the instrument with helium gas to achieve an
approximately 40 % reduction in purge time and helium gas
consumption compared to previous units.
(Option for EDX-7000)
The addition of the turret allows automated continuous
measurements. It improves throughput, especially for measurements
in a vacuum or helium atmosphere.
vacuumair
S K
a
Profile Comparison in Air and Helium After Purging(sample: sulfur in oil)
Heair
C142-E037A_EDX-7000_8000.indd 9 13/11/11 19:05
Comprehensive Quantitation Functions
X-r
ay in
ten
sity
Quantitative elementbackground
Fluorescent X-rayintensity of quantitativeelement
Compton-scatteredradiation from Rh X-raytube target material
Rayleigh-scatteredradiation from RhX-ray tube target material
Energy
Continuous X-rays
10
Automatic Balance Setting Function (Patent pending)
Calibration Curve Method
Background FP Method
Matching Function
Fundamental Parameter (FP) Method
A balance setting is required to use the FP method on principal
components such as C, H, and O. The software automatically sets the
balance if it determines from the profile shape that a balance setting
is required.
This method uses theoretical intensity calculations to determine the
composition from the measured intensities. It’s a powerful tool for
the quantitative analysis of unknown samples in cases where
preparation of a standard sample is difficult. (JP No. 03921872, DE
No. 60042990. 3-08, GB No. 1054254, US No. 6314158)
The instrument offers both the bulk FP method for the analysis of metals,
oxides, and plastics, and the thin-film FP method that supports
composition analysis and thickness measurements of plating and thin films.
A standard sample is measured and the relationship with the fluorescent X-ray intensity
plotted as a calibration curve, which is used for the quantitation of unknown samples.
Although this method requires selection of a standard sample close to the unknown sample
and creation of a calibration curve for each element, it achieves a high level of analysis
accuracy.
This method supports all types of corrections for coexistent elements,
including absorption/excitation correction and correction for
overlapping elements.
The background FP method adds scattered X-ray (background)
calculations to the conventional FP method, which only calculates the
fluorescent X-ray peak intensity (net peak intensity).
(Patent pending : PCT/JP2013/78002, PCT/JP2013/78001)
This method is effective at improving quantitation accuracy for small quantities
of organic samples, film thickness measurements of irregular-shaped plated
samples, and film thickness measurements of organic films.
The matching function compares analysis data for a sample with an
existing data library and displays the results in descending degree of
confidence.
The library contains content data and intensity data and the user can
register each type. The content data values can be entered manually.
Matching Results
C142-E037A_EDX-7000_8000.indd 10 13/11/11 19:05
Functional Design
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 11
300mm275mm
approx.100mm
460m
m
PreviousShimadzu instrument
EDX-7000/8000
Large Sample Chamber with Small FootprintInstalled width is 20% smaller than the previous instrument due to its compact body size.
The EDX-7000/8000 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.
When X-rays are generated, an X-ray indicator at the rear of the instrument and an X-RAYS ON lamp at the front turn on, so
that the instrument status can be monitored even from a distance.
High-Visibility LED Lamp
Body dimensions: W460 × D590 × H360mm
Comparison of footprint between EDX-7000/8000 and previous instrument
C142-E037A_EDX-7000_8000.indd 11 13/11/11 19:05
Simple Screen LayoutSample image display, analysis conditions selection, and sample name input on the same screen.
Collimator Switching from the Measurement ScreenChange the collimator diameter while observing the sample image.
The selected diameter is indicated by a yellow circle.
Automatic Storage of Sample ImagesThe sample image is loaded automatically when the measurement starts. Sample images
are saved with a link to the data file.
PCEDX Navi Sof tware Allows Easy Operation from the Star t
PCEDX Navi software is designed to simplify X-ray fluorescence spectrometry for beginners, while providing the feature set and capabilities demanded by more experienced users. The straightforward user interface offers intuitive operation and provides a convenient operating environment for beginners and experts alike.
12
C142-E037A_EDX-7000_8000.indd 12 13/11/11 19:05
Measurement Setup Screen Using the Turret (sample positioning screen)
Once the measurement is complete, the
element names, concentrations, 3σ
(measurement variance) are displayed, together
with the sample image, in an
easy-to-understand layout.
Display the result list and individual report with
a single mouse click.
PCEDX Navi supports measurements using the
optional turret.
Switch between the sample image screen and
sample positioning screen.
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 13
Measurement Setup Screen
Results Display Screen
Results List (with images)
Support for Continuous Measurements
Measurement Setup Screen
r
h
Results Display Screen
Results List (with images)
Measurement Setup Screen Using the Turret (sample positioning screen)
s
C142-E037A_EDX-7000_8000.indd 13 13/11/11 19:05
EDX-7000/8000 incorporates PCEDX Pro software that has more
flexibility functions. This software offers analysis, conditions settings,
and data processing using familiar operations. It also allows loading
of data profiles and quantitation values acquired with a previous
Shimadzu EDX series instrument.
PCEDX Navi offers instrument initialization and startup (X-ray startup)
with simple mouse-click operations.
After instrument startup, the stabilization function operates for 15
minutes. Analysis and instrument checks are disabled during this
period, ensuring that all users collect data in a stable instrument
environment.
When an X-ray tube has not been used for a long period, it requires
aging before it can be used again. The software automatically
performs the appropriate aging according to the period of non-use.
The software offers password protection. Condition settings
and changes can only be made by a person who enters the
password.
Functions to Enhance Usability
14
Incorporates General Analysis Software
Easy Instrument Star tup Automatic X-ray Tube Aging
Condition Password Protection
C142-E037A_EDX-7000_8000.indd 14 13/11/11 19:05
Lists of the analysis results for multiple samples can be created in Excel format. Data can be selected in the list for detailed display or editing.
A variety of list generation templates is available, including a list of RoHS specific hazardous elements and user-defined lists of elements.
Analysis data reports can be created in HTML or Excel format. A variety of templates is available.
The sample image automatically saved when measurement started is pasted in the report for confirmation of the measurement position.
Various Data Output Formats
User-Definable List of Elements
RoHS Screening Report in Excel Format General Analysis Report in HTML Format
*Microsoft Office Excel must be purchased separately.
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 15
List Creation Functions
Report Creation Functions
*Microsoft Office Excel must be purchased separately.
C142-E037A_EDX-7000_8000.indd 15 13/11/11 19:05
MgO
1.75
1.932
AI2O3
3.95
3.875
SiO2
21.86
22.38
SO3
2.44
2.086
K2O
0.11
0.093
CaO
69.60
67.87
TiO2
0.079
0.084
Mn2O3
0.011
0.0073
Fe2O3
0.18
0.152
ZnO
0.002
(0.001)
SrO
0.023
(0.018)
Element
Quantitation value
Standard value
Units: wt%Comparison of Quantitative Analysis Results and Standard Values by FP Method
Overlaid Profiles of Heavy Elements in Waste Oil
To measure a liquid sample, simply add it to a sample cell with film on the bottom. This method is effective for the detection and quantitation
of additive components and worn metals in aqueous solutions, organic solvents, or oils.
As shown below, the system achieves adequate detection of heavy elements in waste oil at ppm levels.
Comprehensive Applications
Na-S Sr K-Zn
16
Powders (Fine/Coarse Particles) −Qualification and Quantitation of Cement−
Liquid, Slurry and Emulsion −Heav y Elements in Waste Oil−
Sample Appearance (Press formed at 250 kN for 30 s)
Peak Profile of Cement Standard Substance
Sample Appearance (Sample cell, film, 5 mL oil)
Waste oil standard sample (10 ppm each element)
Blank sample
The analysis of powder samples is a typical X-ray fluorescence spectrometry application. The samples can be press-formed or loose in the
sample cell.
The following shows an example of the analysis of a cement standard substance using Na–U qualitative/quantitative analysis, which is the
standard method for powder analysis. Accurate quantitation was achieved without using standard samples. Performing measurements in a
vacuum achieved sensitive measurements of light elements.
Waste oil standard sample (50 ppm each element)
Waste oil standard sample (30 ppm each element)
C142-E037A_EDX-7000_8000.indd 16 13/11/11 19:05
EDX permits non-destructive elemental testing, making it effective for the analysis of foreign matter adhering to or mixed in with foods, drugs,
or products. Using the sample observation camera and collimators makes it easy to identify trace foreign matter.
The 1 mm irradiation diameter is effective at reducing the effects of peripheral material, resulting in accurate quantitative matching. In the
example, the material was identified as SUS316.
EDX is used for the analysis of elements contained in foods and biological samples. It is effective for process control when adding elements to
foods, evaluating the poor growth of crops, and identifying the region or origin.
The new background FP function achieves similar quantitation results with low sample volumes as from adequate sample volumes. It is effective
in research applications when only small samples are available and in eliminating discrepancies due to differences in sample pretreatment by
operators.
Quantitative Analysis Results for ForeignMatter by FP Method
Matching Results (Matching results in internal library.
Substance identified as SUS316.)
The titanium (Ti) and zinc (Zn) peripheral material around the foreign matter are eliminated from the quantitation calculations.
【Comments】With conventional FP, the changes in fluorescent X-ray intensity due to the sample quantity and shape lead to quantitation errors. Background FP eliminates these effects to achieve stable quantitation values. Comparison of Quantitation Values by Background FP and Conventional FP Methods
Difference in Fluorescent X-Ray Intensity Due to Sample Volume
Adequate volume
Low volume_background FP
Low volume_conventional FP
Fe Ka
Fe Kb
Ni Ka
Cr Ka
Cr Ka Mn Kb
Ti Ka
Ti Kb
Ni Kb
Zn Ka
Zn Kb
Mo Ka
Foreign matter
Normal position
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 17
Foreign Matter Material Evaluation −Foreign Matter Adhering to Plastic Extruded Part−
Food, Biological Samples, Plants −Mineral Composition of Algae, Small Samples−
Sample Appearance
Image of Sample (Adequate Volume)
Image of Sample (Low Volume)
Red circle: foreign matterBlue circle: normal position
Overlaid Profiles of Foreign Matter (Red) and Normal Position (Blue)
Qu
anti
tati
on
val
ue(
wt%
)
Adequate volume Low volume
C142-E037A_EDX-7000_8000.indd 17 13/11/11 19:05
Cr
Ka
Pb L
a
Br K
a
Pb L
b1
Sb K
a
Sb K
b
Ba K
a
Comprehensive Applications
Fluorescent X-ray
Cu substrate
Ni, P, Pb
Primary X-ray
18
Hazardous Elements in Products ーEight Stipulated Elements in Toysー
Plating, Thin Films ーFilm Thickness and Composition Measurements of Electroless Nickel Phosphorus Platingー
Quantitative Analys i s Result s by Fi lm FP Method
Sample Appearance
Schematic Representation of Sample
Polyethylene Resin StandardSamples Containing the EightStipulated Elements in Toys
Overall (Paint + plastic base material)
Scraped paint
Plastic base material
Units: mm N.D. = not detected
Peak Profiles of Ni, P, and Pb
In this example with a plastic toy, comparison between measured areas indicated that the painted area contains barium (Ba), chromium (Cr),
The film FP method permits the film thickness measurement of multilayer films, and simultaneous film thickness measurements and
When using the film FP method, the substrate
material, film deposition sequence, and element
Sb
326
293
351
Element
Overall
Scraped paint
Plastic basematerial
As
N.D
N.D
N.D
Ba
351
983
51
Se
12.8
19.1
N.D
Hg
N.D
N.D
N.D
Pb
5010
7918
77
Cr
2697
2013
29
Cd
N.D
N.D
N.D
C142-E037A_EDX-7000_8000.indd 18 13/11/11 19:05
Sample Preparation
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer 19
Solid Samples
Powder Samples
Pulverize samples with coarse particle sizes,
or samples subject to effects of
non-uniformity of mineral particles on the
The glass bead method provides highly
accurate analysis of oxide powders, such as
such as Li2B4O
Cover the bottom of the cell Cover the measuringwindow with film and place
Liquid Samples
Cover the bottom of the cell
If a small volume of sample results in inadequate thickness
Perform measurements onsample dripped onto special
Cover the bottom of the cellwith film and add the sample
Press form the powder with apress machine
Automatic Pulverizer
Pulverizing Samples Glass Bead Method
To enhance the quantitation precision for metal
samples or to eliminate the effects of
contamination or oxidation on the sample
surface, machine and polish the sample surface
Pretreatment of metal samples
Pulverizingcontainer
Flat press heads
Press machine
Lathe
C142-E037A_EDX-7000_8000.indd 19 13/11/11 19:05
Analytical results window using the RoHS, Halogen and Antimony screening kit
標準値(PPM)
Screening Analysis Kits (Option)
0.0 20.0 40.0 60.0 80.0 100.0 0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
PE
PVC
Aluminum
Steel
Brass
Solder
Standard value(ppm)
Mea
sure
d in
ten
sity
rat
io
20
Ideal for RoHS, ELV, and Halogen Screening
Internal Calibration Curves and Automatic Calibration Curve Selection
Automatic calibration curve selection
Internal calibration curves
Shape correction
The optional screening analysis kits allow even beginners to start RoHS, halogen, or antimony screening analysis right from the day of purchase.
Simply mount the sample, select the analysis conditions, enter the sample name, and wait for the results. The analysis results are displayed with
a pass/fail evaluation after just a few minutes.
Internal calibration curves are provided for many materials, making it
unnecessary to provide a large number of standard samples.
The software automatically selects the best calibration curve for the material,
freeing the user from the need to select analysis conditions.
As an incorrect calibration curve selection can result in large error in the
quantitation results, this function contributes to improved data reliability.
The fluorescent X-ray and scattered X-ray intensities are compared for each
element (BG internal standard method) to eliminate the effects of the sample
shape and thickness in the quantitation values.
C142-E037A_EDX-7000_8000.indd 20 13/11/11 19:05
Simple Setup Screen of RoHS Screening Analysis Kit
Clearly above the control standard, so measurement is cut off.
Gray zone. Measurement proceeds for the set time.
Clearly below the control standard, so measurement is cut off.
Concentration
Stan
dard
val
ue
Energy Dispersive X-Ray Fluorescence Spectrometer 21
Three screening Analysis kits are available to suit dif ferent applications.
Automatic Measurement Time Reduction
EDX-7000/8000Energy Dispersive X-Ray Fluorescence Spectrometer
Screening Simple Setup Screen
Threshold Values
Evaluation Charac ter String
Repor t Template
RoHS Screening Analysis Kit
RoHS and Halogen Screening Analysis Kit
RoHS, Halogen, and Antimony Screening Analysis Kit
This function automatically switches to the next analysis channel if a
controlled substance clearly has a high or low concentration, making
evaluation possible while measurement is underway. This achieves
more efficient screening analysis.
A threshold value can be set for each material and element. The screening
evaluation method changes according to how the threshold values are set.
Character strings can be set for display in the analysis results when the
threshold value is not exceeded, in the gray zone, and when the threshold
value is exceeded.
Set the report style from among the templates supplied as standard.
Kit for screening cadmium, lead, mercury, chromium, and
bromine. Polyethylene samples containing these five elements
are supplied in the kit for instrument management.
In addition to cadmium, lead, mercury, chromium, and bromine,
this kit also supports the screening of chlorine in plastics.
Polyethylene samples containing these six elements are supplied
in the kit for instrument management.
In addition to cadmium, lead, mercury, chromium, and bromine,
this kit also supports the screening of chlorine and antimony in
plastics. Polyethylene samples containing these seven elements
are supplied in the kit for instrument management.
Gray zone
Below control standard
Above control standard
C142-E037A_EDX-7000_8000.indd 21 13/11/11 19:05
X-ray fluorescence spectrometry
Energy dispersion
Solids, liquids, powders
11Na to 92U (EDX-7000) 6C to 92U (EDX-8000)
W 300 × D 275 × approx.H 100 mm (excluding radiuses)
5kg (200g per sample when using turret, Gross mass 2.4kg)
Rh target
4 kV to 50 kV
1 μA to 1000 μA
Air-cooled (with fan)
Automatic switching in four stages: 1, 3, 5, and10 mm diameter
Five types (six, including the open position),automatic replacement
Silicon drift detector (SDD)
Not required (electronic cooling)
Air, vacuum*1, helium (He)*2
12-sample turret
Semiconductor camera
Specifications
Units: mm
22
Installation Example
2 GB min. (32-bit), 4 GB min. (64-bit)
250 GB min.
Super multi drive
Windows 7 (32-bit/64-bit)*3
Measurement/analysis software
Calibration curve method, correction for coexistent elements,FP method, film FP method, background FP method
Intensity/content
Automatic calibration functions(energy calibration, FWHM calibration)
10 °C to 30 °C (temperature fluctuation rate 2 °C/hourmax., temperature fluctuation range: 10 °C max.)
40 % to 70 % (no condensation)
100 V AC ±10 %, 15 A earthed socket
W 460 × D 590 × H 360 mm
Approx. 45 kg
Vacuum measurement unit (optional) consists of a control
switch box and rotary pump.
*1 Option for EDX-7000/8000
*2 Option for EDX-7000
*3 Microsoft Office is not included.
200 min.
750
158
429
460
360
1200
590
160
249
Rotary pump Switch box
Measurement principle
Measurement method
Target samples
Measuring range
Sample size
Maximum sample mass
X-ray generator
X-ray tube
Voltage
Current
Cooling method
Irradiated area
Primary filters
Detector
Type
Liquid nitrogen
Sample chamber
Measurement atmosphere
Sample replacement*
Sample observations
Data processor
Memory
HDD
Optical drive
OS
Software
Qualitative analysis
Quantitative analysis
Matching software
Utilities
Instrument statusmonitoring function
Analysis results tabulationfunction
Installation
Temperature
Relative humidity
Power supply
Dimensions
Weight
This product conforms to Shimadzu’sEco-labeled designation.
* Energy savings: 44.1% reduction as compared to the previous model
C142-E037A_EDX-7000_8000.indd 22 13/11/11 19:05
Options
3571 General Open-End X-Cell (no lid)
P/N 219-85000-55 (100 cells/set)
(Outer diameter: 31.6 mm, volume: 10 mL)
Polyethylene sample cell for liquid and powder
samples.
3577 Micro X-Cell
P/N 219-85000-54 (100 cells/set)
(Outer diameter: 31.6 mm, volume: 0.5 mL)
For trace samples. Recommended for use with a
collimator.
3529 General X-Cell (with lid)
P/N 219-85000-52 (100 cells/set)
(Outer diameter: 32 mm, volume: 8 mL)
For liquid samples. Equipped with a relief hole
and liquid retainer in case of liquid expansion.
3561 Universal X-Cell
P/N 219-85000-53 (100 cells/set)
(Outer diameter: 31.6 mm, volume: 8 mL)
For liquid and thin-film samples. Equipped with a
relief hole and liquid retainer in case of liquid
expansion. Equipped with a ring to tightly hold
thin-film samples with film.
P/N 212-25475-41
RoHS/ELV Screening Analysis Kit
With check samples for five elements
P/N 212-25476-41
RoHS and Halogen Screening Analysis Kit
With check samples for six elements
P/N 212-25477-41
RoHS, Halogen, and Antimony Screening Analysis Kit
With check samples for seven elements
23
Sample CellsVacuum Measurement Unit P/N 212-25425-42
Turret Unit P/N 212-25389-41
Screening Analysis Kits
Helium Purge Unit P/N 212-25440-41
Mylar Fi lm
P/N 202-86501-56 (500 sheets/set)
Sample-holding film (for heavy element analysis)
Polypropylene Fi lm
P/N 219-82019-05 (73 mm W × 92 m roll)
Sample-holding film (for light element analysis)
* Windows is a registered trademark of Microsoft Corporation (USA) in the United States and other countries.* Additionally noted company names and product names are the trademarks or registered trademarks of the respective companies.* The notations TM and ® are not used in this document.
Use this unit for sensitive measurements of light elements. It requires
space for installation of a rotary pump and switch box at the side or
rear of the desk supporting the main unit.
Turret for 12 samples. It permits
continuous measurements of
samples up to 32 mm in diameter. It
improves throughput, especially for
measurements in a vacuum or
helium atmosphere.
This unit is used for highly sensitive measurements of light elements
in liquid samples. Does not include a helium cylinder or regulator.
(Option for EDX-7000)
C142-E037A_EDX-7000_8000.indd 23 13/11/11 19:05
EDX
-700
0/80
00
Printed in Japan 3655-10316-30AIK
Company names, product/service names and logos used in this publication are trademarks and trade names of Shimadzu Corporation or its affiliates, whether or not they are used with trademark symbol “TM” or “®”.Third-party trademarks and trade names may be used in this publication to refer to either the entities or their products/services. Shimadzu disclaims any proprietary interest in trademarks and trade names other than its own.
For Research Use Only. Not for use in diagnostic procedures. The contents of this publication are provided to you “as is” without warranty of any kind, and are subject to change without notice. Shimadzu does not assume any responsibility or liability for any damage, whether direct or indirect, relating to the use of this publication.
© Shimadzu Corporation, 2013www.shimadzu.com/an/
This unit is designated as an X-ray device.
Caution
C142-E037A_EDX-7000_8000.indd 24 13/11/11 19:05